2

Analysis of errors in the photometric monitoring of layer thickness

Année:
2001
Langue:
english
Fichier:
PDF, 20 KB
english, 2001
7

Determining the parameters of optical thin films by a spectrophotometric method

Année:
2004
Langue:
english
Fichier:
PDF, 39 KB
english, 2004
10

Laser reflector with an interference coating

Année:
1998
Langue:
english
Fichier:
PDF, 118 KB
english, 1998
12

Structure Formation in Disperse Systems in an Electric Field

Année:
1968
Langue:
english
Fichier:
PDF, 1.20 MB
english, 1968
13

Optimization of sensors based on surface waves in flat-layered structures

Année:
2017
Langue:
english
Fichier:
PDF, 446 KB
english, 2017